Multistage interconnection network reliability
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 38 (11) , 1600-1604
- https://doi.org/10.1109/12.42134
Abstract
The authors examine the reliability of a unique-path multistage interconnection network (MIN) and a fault-tolerant scheme aimed at improving system reliability. They derive closed-form expressions for the time-dependent reliability of the 8*8 and 16*16 shuffle-exchange multistage interconnection networks (SENs) and SENs with an addition state (SEN+). These expressions are derived without any assumptions regarding the underlying component-lifetime distributions. They derive a tight reliability lower bound that is useful for the analysis of larger networks. They provide numerical results for networks as large as 1024*1024.Keywords
This publication has 10 references indexed in Scilit:
- A Survey and Comparision of Fault-Tolerant Multistage Interconnection NetworksComputer, 1987
- Augmented Shuffle-Exchange Multistage Interconnection NetworksComputer, 1987
- A Connecting Network with Fault Tolerance CapabilitiesIEEE Transactions on Computers, 1986
- Bounds on the Reliability of NetworksIEEE Transactions on Reliability, 1986
- Fault Tolerance in Binary Tree ArchitecturesIEEE Transactions on Computers, 1984
- The Extra Stage Cube: A Fault-Tolerant Interconnection Network for SupersystemsIEEE Transactions on Computers, 1982
- The Gamma networkACM SIGARCH Computer Architecture News, 1982
- Performance and fault tolerance improvements in the Inverse Augmented Data Manipulator networkACM SIGARCH Computer Architecture News, 1982
- A Survey of Interconnection NetworksComputer, 1981
- On a Class of Multistage Interconnection NetworksIEEE Transactions on Computers, 1980