Structural characterization of tin selenide thin films
- 1 June 1985
- journal article
- Published by Springer Nature in Journal of Materials Science Letters
- Vol. 4 (6) , 743-745
- https://doi.org/10.1007/bf00726977
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- X-Ray Studies on the Microstructure of Vacuum Evaporated SnTe Thin FilmsPhysica Status Solidi (a), 1982
- Structural defects and photosensitivity in evaporated lead selenide filmsJournal of Materials Science Letters, 1982
- Study of photoconductive PbTe films by the method of variance analysis of X-ray diffraction profilesJournal of Physics D: Applied Physics, 1976
- Ovonic type switching in tin selenide thin filmsJournal of Vacuum Science and Technology, 1975
- Structural defects in chemically deposited photoconducting films of PbSJournal of Physics D: Applied Physics, 1971
- A Numerical Fourier-analysis Method for the Correction of Widths and Shapes of Lines on X-ray Powder PhotographsProceedings of the Physical Society, 1948