X-Ray Studies on the Microstructure of Vacuum Evaporated SnTe Thin Films
- 16 August 1982
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 72 (2) , 521-527
- https://doi.org/10.1002/pssa.2210720212
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Transport properties of SnTe interpreted by means of a two valence band modelMaterials Research Bulletin, 1981
- Annealing behavior of quench-deposited amorphous GeTe and SnTe filmsJournal of Non-Crystalline Solids, 1977
- Study of photoconductive PbTe films by the method of variance analysis of X-ray diffraction profilesJournal of Physics D: Applied Physics, 1976
- Role of defects in determining the electrical properties of CdS thin films. I. Grain boundaries and surfacesJournal of Applied Physics, 1972
- Analytic approximation for incoherent scattered X-ray intensitiesActa Crystallographica Section A, 1971
- Background errors in X-ray diffraction parametersBritish Journal of Applied Physics, 1966
- Scattering factors computed from relativistic Dirac–Slater wave functionsActa Crystallographica, 1965
- Determination of particle size and strain in a distorted polycrystalline aggregate by the method of varianceActa Crystallographica, 1964
- A method for converting experimental X-ray intensities to an absolute scaleActa Crystallographica, 1956
- III. Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray debye-scherrer spectrumPhilosophical Magazine, 1956