Magnetic Softness and Domain Wall Structures of Double-Layered Amorphous Co-Zr-Nb Films

Abstract
The magnetization process, domain wall structures and soft magnetic properties of amorphous Co-Zr-Nb double-layered films with various uniaxial anisotropies were investigated. Observation of the domain structure showed that intermediate SiO2 films formed by sputtering prevent direct exchange coupling between the magnetic films when their thicknesses are above 20 Å. A different magnetization process from those found in Permalloy multilayered films formed by evaporation was seen in the present amorphous films. The drastic improvement of the magnetic softness in double-layered films with very thin magnetic and nonmagnetic layers is useful for improving the recording density in perpendicular magnetic recording systems.

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