Temperature-scaling theory for deep-submicron MOSFET operated at low temperature
- 13 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 104-108
- https://doi.org/10.1109/ltse.1989.50191
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Temperature-Scaling Theory for Low-Temperature-Operated MOSFET with Deep-Submicron ChannelJapanese Journal of Applied Physics, 1988