Abstract
We have developed a new method for density measurements by means of X-ray absorption under high pressure and high temperature using a multi-anvil apparatus combined with a synchrotron-radiation source. To overcome the effect of the variation of the sample thickness under pressure, a sapphire ball was put in the sample capsule as a calibrant of the thickness, and the intensity of the transmitted X-ray beam was measured as a function of the sample position. The densities of crystalline and liquid tellurium were measured up to 5 GPa and up to 700°C. Discontinuous changes in the density at the Te I-Te 11 transition and at the melting were clearly observed.

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