Uniform and graded multilayers as x-ray optical elements
- 15 April 1983
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 22 (8) , 1241-1246
- https://doi.org/10.1364/ao.22.001241
Abstract
A detailed comparison of the performance of uniform and graded multilayers as soft x-ray monochromators and normal incidence collectors has been made. In particular, the responses of flat depth-, and laterally graded multilayers to Al Kα radiation, λ = 8.34 Å, have been computed and compared with the corresponding uniform multilayer. Furthermore, the efficiency of graded and uniform multilayers as normal incidence x-ray collectors has been calculated in terms of effective areas for parabolic reflectors tuned to the O Kα line, λ = 23.7 Å. Finally, the effective areas of four strong solar emission lines in the 30–60 Å region have been computed for uniform multilayers. Normal incidence multilayer mirrors are well suited for spectroheliograph type of applications.Keywords
This publication has 8 references indexed in Scilit:
- Multilayer mirrors and beam splitters for soft X-raysOptics Communications, 1982
- Bragg diffractors with graded-thickness multilayersNuclear Instruments and Methods in Physics Research, 1982
- Imaging performance of a normal incidence soft x-ray telescopeApplied Physics Letters, 1982
- Soft X-ray imaging with a normal incidence mirrorNature, 1981
- Long-wave X-ray radiation mirrorsOptics Communications, 1981
- X-ray diffraction in multilayersOptics Communications, 1981
- Controlled fabrication of multilayer soft-x-ray mirrorsApplied Physics Letters, 1980
- Coronal Emission-Line Intensities in the Extreme UltravioletThe Astrophysical Journal, 1966