Analytic inversion of ellipsometric data for an unsupported nonabsorbing uniform layer
- 1 October 1990
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 7 (10) , 1875-1877
- https://doi.org/10.1364/josaa.7.001875
Abstract
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This publication has 3 references indexed in Scilit:
- Reflection and transmission ellipsometry of a uniform layerJournal of the Optical Society of America A, 1987
- Ellipsometer Data Analysis with a Small Programmable Desk CalculatorApplied Optics, 1972
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963