Use of XPS to detect variations in dispersion of impregnated and ion‐exchanged NiO/SiO2 systems
- 1 June 1981
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 3 (3) , 103-105
- https://doi.org/10.1002/sia.740030302
Abstract
The use of XPS intensity measurements to follow the dispersion of impregnated and ion‐exchanged NiO/SiO2 samples has been examined. Intensity measurements clearly demonstrate the profound difference in dispersion between the two series. Moreover, as revealed by comparison with independent dispersion measurements, they adequately predict the evolution of the dispersion of NiO as a function of nickel content in the impregnated series.Keywords
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