Density gradient in SiO2 films on silicon as revealed by positron annihilation spectroscopy
- 1 June 2002
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 194 (1-4) , 101-105
- https://doi.org/10.1016/s0169-4332(02)00096-x
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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