Focused Slow Ion Beam for Study of Electron Ejection from Solids

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Abstract
This paper reports advances in the operation of the ion lens system used in studies of electron ejection by slow ions which make it possible to conduct the experiment with ion energies as low as 4 eV. Ejected electrons may be retarded by as much as 20 eV in the presence of this beam. Significant differences in electron kinetic energy distributions for ion energies differing by as little as 1 eV in the lower energy range are observed. Electrode arrangements and circuit innovations including amplifier calibration and negative feedback stabilization of the ion beam are discussed. Criteria for proper lens performance are given and experimental data illustrating the meeting of these criteria are presented. Examples of lens failure are also shown.