Current Noise due to Ohmic Contacts on Cadmium Sulfide
- 1 August 1960
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 31 (8) , 1343-1344
- https://doi.org/10.1063/1.1735839
Abstract
Current noise measurements on the same lightly doped cadmium sulfide crystal having indium soldered contacts of different quality are used to demonstrate the strong influence of contacts on the observed noise spectra. The results suggest the presence of shallow trapping states distributed in energy and located near the electrodes. The concentration of these states depends on the quality of the contact. These effects are not contact noise in the usual sense since the shape of the noise spectra is only moderately affected; however, the noise level may change by orders of magnitude.This publication has 6 references indexed in Scilit:
- Frequency Factor and Energy Distribution of Shallow Traps in Cadmium SulfidePhysical Review B, 1960
- Measurements of noise and response to modulated light of cadmiumsulphide single crystalsPhysica, 1956
- Electronic fluctuations in semiconductorsBritish Journal of Applied Physics, 1955
- Measurement of Shot Noise in CdS CrystalsPhysical Review B, 1955
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- Spontaneous Resistance Fluctuations in Carbon Microphones and Other Granular ResistancesBell System Technical Journal, 1936