Novel contactless electroreflectance spectroscopy of semiconductors
- 5 February 1990
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 56 (6) , 545-547
- https://doi.org/10.1063/1.102740
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Optical transitions involving unconfined energy states in As/GaAs multiple quantum wellsPhysical Review B, 1989
- Observation of compressive and tensile strains in InGaAs/GaAs by photoluminescence spectroscopyApplied Physics Letters, 1988
- Noncontact doping level determination in GaAs using photoreflectance spectroscopyJournal of Applied Physics, 1987
- Disclinations in solidsPhysica Status Solidi (a), 1983
- Differential reflectometry and its application to the study of alloys, ordering, corrosion, and surface propertiesPhysica Status Solidi (a), 1983
- Third-derivative modulation spectroscopy with low-field electroreflectanceSurface Science, 1973
- Photoreflectance Line Shape at the Fundamental Edge in Ultrapure GaAsPhysical Review B, 1970
- Optical Reflectivity Measurements on Alloys by Compositional ModulationPhysical Review Letters, 1970
- Reflectance Modulation by the Surface Field in GaAsPhysical Review Letters, 1968
- Electroreflectance in the GaAs-GaP AlloysPhysical Review B, 1966