Limitations and improvements of trace element analysis with proton-induced X-rays
- 1 December 1972
- journal article
- Published by Springer Nature in Journal of Radioanalytical and Nuclear Chemistry
- Vol. 12 (2) , 171-179
- https://doi.org/10.1007/bf02520986
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- An investigation of the analytical capabilities of X-ray emission induced by high energy alpha particlesNuclear Instruments and Methods, 1971
- X-ray emission induced by 30 to 80 MeV alpha particlesNuclear Physics A, 1970
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970