Bulk lifetime determination of MOS structures by a voltage step response method
- 1 March 1978
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 21 (3) , 561-564
- https://doi.org/10.1016/0038-1101(78)90027-8
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Determination of generation lifetime from the small-signal transient behavior of MOS capacitorsSolid-State Electronics, 1975
- Field-enhanced carrier generation in MOS capacitorsSolid-State Electronics, 1974
- A linear-sweep MOS-C technique for determining minority carrier lifetimesIEEE Transactions on Electron Devices, 1972
- On the determination of minority carrier lifetime from the transient response of an MOS capacitorIEEE Transactions on Electron Devices, 1967