Reliability of new semiconductor devices for long-distance optical submarine-cable systems
- 1 April 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 37 (1) , 3-13
- https://doi.org/10.1109/24.3706
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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