Atomic Resolution Noncontact Atomic Force and Scanning Tunneling Microscopy of TiO2(110)(1×1) and - (1×2): Simultaneous Imaging of Surface Structures and Electronic States

Abstract
We present simultaneous imaging of TiO2(110)(1×1) and - (1×2) using noncontact atomic force microscopy (NC-AFM) and scanning tunneling microscopy (STM). The surface topography was imaged under NC-AFM feedback, while the surface electronic states were imaged by STM. The image contrasts of NC-AFM and STM were antiphase in (1×1) and in phase in (1×2). The uppermost oxygen and Ti atoms underneath were, respectively, imaged by NC-AFM and STM. The NC-AFM image contrast was close to the true surface topography in (1×2), but reduced in (1×1).