Atomic Resolution Noncontact Atomic Force and Scanning Tunneling Microscopy of and - : Simultaneous Imaging of Surface Structures and Electronic States
- 7 May 2001
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 86 (19) , 4334-4337
- https://doi.org/10.1103/physrevlett.86.4334
Abstract
We present simultaneous imaging of and - using noncontact atomic force microscopy (NC-AFM) and scanning tunneling microscopy (STM). The surface topography was imaged under NC-AFM feedback, while the surface electronic states were imaged by STM. The image contrasts of NC-AFM and STM were antiphase in and in phase in . The uppermost oxygen and Ti atoms underneath were, respectively, imaged by NC-AFM and STM. The NC-AFM image contrast was close to the true surface topography in , but reduced in .
Keywords
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