Relationship between the p and s Fresnel reflection coefficients of an interface independent of angle of incidence
- 1 July 1986
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 3 (7) , 928-929
- https://doi.org/10.1364/josaa.3.000928
Abstract
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This publication has 4 references indexed in Scilit:
- Simple and direct determination of complex refractive index and thickness of unsupported or embedded thin films by combined reflection and transmission ellipsometry at 45° angle of incidenceJournal of the Optical Society of America, 1983
- Direct relation between Fresnel’s interface reflection coefficients for the parallel and perpendicular polarizationsJournal of the Optical Society of America, 1979
- Relations between amplitude reflectances and phase shifts of the p and s polarizations when electromagnetic radiation strikes interfaces between transparent mediaApplied Optics, 1979
- Definitions and conventions in ellipsometrySurface Science, 1969