Surface Structure of Si(111)- √3 ×√3-Ag Studied by Averaged LEED Analysis

Abstract
Low energy electron diffraction constant momentum transfer average (LEED/CMTA) technique has been applied to the Ag/Si(111) surface. The specularly reflected (00) beam analysis for the Si(111)- √3×√3-Ag structure verifies the recently proposed model where the ordered Ag layer is embedded below the topmost Si layer. A considerable displacement of the Si subsurface is also suggested.