Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry
- 1 May 2004
- journal article
- research article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 76 (11) , 3199-3207
- https://doi.org/10.1021/ac035532n
Abstract
The feasibility of using cluster secondary ion mass spectrometry for depth profiling of drug delivery systems is explored. The behavior of various biodegradable polymer films under dynamic SF5+ primary ion bombardment was investigated, including several films doped with model drugs. The SF5+ depth profiles obtained from these biodegradable polymer films showed very little degradation in secondary ion signal as a function of increasing primary ion dose, and it was discovered that the characteristic ion signals for the polymers remained constant for ion doses up to ∼5 × 1015 ions/cm2. These results suggest that the polyester structure of the biodegradable polymers studied here allows for a greater ability to depth profile due to ease of main chain scission. Attempts were also made to depth profile through a series of poly(lactic acid) (PLA) films containing varying concentrations of the drug 4-acetamidophenol. The depth profiles obtained from these films show very little decrease in both the 4-acetamidophenol molecular ion and PLA fragment ion signals as a function of increasing SF5+ primary ion dose. Similar results were obtained with theophylline-doped PLA films. These results show that, in some drug delivery devices, it is possible to monitor the distribution of a drug as a function of depth by using cluster primary ion beams.Keywords
This publication has 15 references indexed in Scilit:
- Impact Energy Dependence of SF5+-Induced Damage in Poly(methyl methacrylate) Studied Using Time-of-Flight Secondary Ion Mass SpectrometryAnalytical Chemistry, 2004
- In vitro–in vivo characterization of gentamicin bone implantsJournal of Controlled Release, 2002
- Development of a triplasmatron ion source for the generation of SF5+ and F− primary ion beams on an ion microscope secondary ion mass spectrometry instrumentJournal of Vacuum Science & Technology A, 1999
- Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardmentApplied Surface Science, 1998
- Polymer Blend Implant for Ocular Delivery of Fluorometholone.Biological & Pharmaceutical Bulletin, 1998
- SIMS MICROSCOPY: METHODOLOGY, PROBLEMS AND PERSPECTIVES IN MAPPING DRUGS AND NUCLEAR MEDICINE COMPOUNDSCell Biology International, 1997
- Information on the Monomer Sequence of Poly(lactic acid) and Random Copolymers of Lactic Acid and Glycolic Acid by Examination of Static Secondary Ion Mass Spectrometry Ion IntensitiesMacromolecules, 1996
- Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organicsAnalytical Chemistry, 1989
- An XPS and SIMS analysis of biodegradable biomedical polyestersSurface and Interface Analysis, 1989
- SSIMS and SIMS imaging analysis of a drug delivery systemSurface and Interface Analysis, 1988