Generation-recombination noise at 77°K in silicon bars and JFETs

This publication has 2 references indexed in Scilit:

• Noise of hot carriers in the channel of n silicon junction gate field effect transistors
  Solid-State Electronics, 1978
• Experimental determination of highly concentration-sensitive effects of intervalley electron-electron scattering on electric-field-dependent repopulation in n-Si at 77 K
  Applied Physics Letters, 1974