Neutralization and ionization of low energy helium ions scattering from a copper surface

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Abstract
Ion yield measurements are presented |of 2–10 keV helium ions scattered from a copper (100) face. The scattering angle is 30°. The results are explained using a charge transfer model originally proposed by the authors. The model takes into account Auger neutralization as well as ionization and neutralization resulting from a violent collision. The present results are compared with previous] experiments in which a primary atom beam was used. Within the experimental errors the results |of both experiments can be explained using the same charge exchange parameters. A second result of the present investigation is that more convincing evidence is given for the occurrence of neutralization during the violent collision by a non-Auger process. It is probable that this process, as well as the ionization process, results from an interaction between the helium particle and the copper L shell electrons.