A new method of determining structure factors of x-rays using half-value widths of diffraction curves from perfect crystals
- 19 October 1970
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 33 (3) , 151-152
- https://doi.org/10.1016/0375-9601(70)90702-4
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Absolute measurement of structure factors using a new dynamical interference effectActa Crystallographica Section A, 1970
- Accuracies of experimental structure factor valuesActa Crystallographica Section A, 1969
- X-ray scattering factors computed from numerical Hartree–Fock wave functionsActa Crystallographica Section A, 1968
- A method of obtaining an extremely parallel X-ray beam by successive asymmetric diffractions and its applicationsActa Crystallographica Section A, 1968
- A theoretical calculation of X-ray absorption cross sectionsActa Crystallographica, 1967
- Absolute Measurement of Structure Factors of Si Single Crystal by Means of X-Ray Pendellösung FringesJournal of the Physics Society Japan, 1965
- Absolute X-Ray Scattering Factors of Silicon and GermaniumPhysical Review B, 1965
- Anomalous dispersion corrections computed from self-consistent field relativistic Dirac–Slater wave functionsActa Crystallographica, 1965
- Vibrational Amplitudes in Germanium and SiliconPhysical Review B, 1962
- Intensity of X-ray reflexion from perfect and mosaic absorbing crystalsActa Crystallographica, 1950