Photoelectron Emission and Photoluminescence from SiO2-Si Samples
- 16 October 1992
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 133 (2) , 385-394
- https://doi.org/10.1002/pssa.2211330222
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Hot-electron dynamics instudied by soft-x-ray-induced core-level photoemissionPhysical Review B, 1991
- Charge Trap Spectroscopy in Single and Multiple Layer DielectricsPhysica Status Solidi (a), 1990
- Cathodoluminescence of Intrinsic Defects in Glassy SiO2, Thermal SiO2 Films, and α-QuartzPhysica Status Solidi (a), 1986
- Luminescence in Germanium-Doped Glassy SiO2Physica Status Solidi (a), 1984
- Monte-Carlo Approach of Electron Emission from SiO2Physica Status Solidi (a), 1984
- Photoelectric properties and the energy gap of SiPhysical Review B, 1982
- Transmission, photoconductivity, and the experimental band gap of thermally grown SifilmsPhysical Review B, 1979
- A study of SiO layers on Si using cathodoluminescence spectraSolid-State Electronics, 1973
- The band edge of amorphous SiO2 by photoinjection and photoconductivity measurementsSolid State Communications, 1971