Oxidation Rate and Oxide Structural Defects
- 1 January 1967
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Epitaxially induced strains in Cu2O films on copper single crystals—I X-ray diffraction effectsActa Metallurgica, 1962
- A determination of thin oxide film thickness by integrated intensity measurementsActa Crystallographica, 1961
- The structure of oxide films formed on smooth faces of a single crystal of copperActa Metallurgica, 1957
- The structure of oxide films on different faces of a single crystal of copperActa Metallurgica, 1956
- Anisotropy of grain boundary self-diffusionActa Metallurgica, 1956
- Die Verwachsungen von Kupfer mit seinem OxydulAnnalen der Physik, 1949