Microwave-detected photoconductance decay
- 4 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
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- Non-destructive lifetime measurement in silicon wafers by microwave reflectionSolid-State Electronics, 1987
- The study of charge carrier kinetics in semiconductors by microwave conductivity measurementsJournal of Applied Physics, 1986