Evidence for intrinsic interfacial strain in lattice-matched As/InP heterostructures
- 15 August 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 44 (8) , 3991-3994
- https://doi.org/10.1103/physrevb.44.3991
Abstract
A fully dynamical high-resolution x-ray-diffraction study of a nominally lattice-matched As/InP heterostructure has been carried out. This study reveals the presence of net intrinsic interfacial strains that are produced by the difference in bond lengths on each side of the interfaces.
Keywords
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