Defects in SiO2 in buried-oxide structures formed by O+ implantation
- 1 May 1988
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 32 (1) , 433-436
- https://doi.org/10.1016/0168-583x(88)90251-0
Abstract
No abstract availableKeywords
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