In-situ EXAFS Observation of the Molecular Reaction Intermediate for NO–H2 Reaction on Highly Active Rh–Sn/SiO2 Catalysts

Abstract
In-situ EXAFS technique was successful by applied for the first time to observe the molecular reaction intermediate for NO–H2 reaction on highly active Rh–Sn/SiO2 catalysts. The EXAFS data, with the aid of FTIR, revealed the existence the bent-type NO with the bond distance of 0.256 nm with Sn atoms (Rh–NO···Sn) on the bimetallic surface in the steady-state reaction conditions. The tilted NO was dissociated to form Sn–O bond at 0.205 nm.