Test Generation for Programmable Logic Arrays
- 1 January 1982
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 574-580
- https://doi.org/10.1109/dac.1982.1585555
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Multiple Fault Detection in Programmable Logic ArraysIEEE Transactions on Computers, 1980
- Detection of Faults in Programmable Logic ArraysIEEE Transactions on Computers, 1979
- Fault Analysis and Test Generation for Programmable Logic Arrays (PLA's)IEEE Transactions on Computers, 1979
- A Testing Strategy for PLAsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1978