Charged Defect State Distributions Obtained from the Analysis of Photoconductivities in Intrinsic a-Si:H Films
- 1 January 1994
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- The defect-pool model and charged defects in amorphous siliconJournal of Non-Crystalline Solids, 1993
- Improved defect-pool model for charged defects in amorphous siliconPhysical Review B, 1993
- Differences between light induced and native midgap states in intrinsic hydrogenated amorphous silicon obtained from detailed modeling of photoconductivities and subband-gap absorptionApplied Physics Letters, 1992
- Potential Role for Charged Dangling Bonds in Transient-Lesr of Light-Soaked a-Si:HMRS Proceedings, 1992
- Effect of midgap states in intrinsic hydrogenated amorphous silicon on sub-band-gap photoconductivityApplied Physics Letters, 1991
- Potential fluctuations due to inhomogeneity in hydrogenated amorphous silicon and the resulting charged dangling-bond defectsPhysical Review B, 1990
- Light-induced dangling bonds in hydrogenated amorphous siliconApplied Physics Letters, 1981
- Photoconductivity, trapping, and recombination in discharge-produced, hydrogenated amorphous siliconPhysical Review B, 1981
- Reversible conductivity changes in discharge-produced amorphous SiApplied Physics Letters, 1977
- Nonequilibrium Steady-State Statistics and Associated Effects for Insulators and Semiconductors Containing an Arbitrary Distribution of TrapsPhysical Review B, 1971