Angular and energy dependences of the scattered ion yield in low-energyHe+4-Bi scattering

Abstract
Measurements of the scattered ion yield Y vs primary energy E and scattering angle θ on a set of bismuth surfaces are reported. The Y(E) curve exhibits a shift of the maxima to lower energies with decreasing θ and a steep rise at low energy in the low-θ range. In addition to this rise, the Y(θ) curve displays an unexpected maximum. The results are tentatively interpreted in terms of a combination of quasiresonant and Auger-type neutralization processes.