Angular and energy dependences of the scattered ion yield in low-energyHe+4-Bi scattering
- 1 November 1977
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 16 (9) , 3903-3907
- https://doi.org/10.1103/physrevb.16.3903
Abstract
Measurements of the scattered ion yield vs primary energy and scattering angle on a set of bismuth surfaces are reported. The curve exhibits a shift of the maxima to lower energies with decreasing and a steep rise at low energy in the low- range. In addition to this rise, the curve displays an unexpected maximum. The results are tentatively interpreted in terms of a combination of quasiresonant and Auger-type neutralization processes.
Keywords
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