TEM characterization of the interface quality of MOVPE grown strained InGaAs/GaAs heterostructures
- 16 July 1995
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 150 (1) , 427-437
- https://doi.org/10.1002/pssa.2211500137
Abstract
No abstract availableKeywords
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