Ferromagnetic Resonance of Mn/Sb Multilayered Films with Artificial Superstructure

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Abstract
Ferromagnetic resonance of epitaxially grown Mn/Sb multilayered films is studied between 4.2 and 270 K. The resonance field depends systematically on the MnSb layer thickness ranging from 3.6 to 43 Å. Uniaxial anisotropy constants, K 1 and K 2 are determined for each sample from the angular dependence of the resonance field. The easy axis for the magnetization turns from in the plane of the film to along normal to the film for the thickness less than 7.2 Å at 4.2 K. A possible interfacial effect on the change of the easy direction is proposed.