Fitting the Weibull log-linear model to accelerated life-test data
- 1 June 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 49 (2) , 217-223
- https://doi.org/10.1109/24.877341
Abstract
The Weibull log-linear model is a widely-used accelerated life-test model in reliability engineering. The standard deviation of log(life), s, was often assumed to be a constant or stress-independent. However, theoretical and experimental research results suggest that, in many cases, s is stress-dependent. The data analysis via the MLE method must be performed numerically, because of the complexity of the model and many unknown parameters being involved. The commonly-used methods often fail to converge when the starting point is not close to the solution, especially for censored data. Generally, no easy-to-use software is available for the Weibull log-linear model. To facilitate this process, an efficient algorithm is presented in this paper, to obtain the MLE of the model parameters from test data (with or without censoring) for both stress-independent and stress-dependent models. The validity and effectiveness of this procedure are illustrated with numerical examples. The method is numerically stable, and easy to implement and program.Keywords
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