Transmission Electron Microscopy of Fast-Neutron-Irradiated Silicon
- 1 June 1966
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 37 (7) , 2912
- https://doi.org/10.1063/1.1782152
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Electron Microscope Observation of High-Energy-Neutron-Irradiated GermaniumJournal of Applied Physics, 1965
- Investigations of Oxygen-Defect Interactions between 25 and 700°K in Irradiated GermaniumPhysical Review B, 1965
- Observation of damage regions inn-type germanium by means of a chemical etchIl Nuovo Cimento (1869-1876), 1963
- DIRECT OBSERVATION OF NEUTRON DAMAGE IN GERMANIUMApplied Physics Letters, 1962
- Nature of Bombardment Damage and Energy Levels in SemiconductorsJournal of Applied Physics, 1959
- Disordered Regions in Semiconductors Bombarded by Fast NeutronsJournal of Applied Physics, 1959
- Measurement of the Range of Recoil AtomsPhysical Review Letters, 1958