Ferroelectric properties in epitaxially grown BaxSr1−xTiO3 thin films
- 15 June 1995
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 77 (12) , 6461-6465
- https://doi.org/10.1063/1.359120
Abstract
Induced ferroelectricity was observed in epitaxially grown BaxSr1−xTiO3 (BST) thin films with thicknesses of about 220 nm. The BST films with various Ba content were deposited at 600 °C on Pt/MgO substrates, by radio frequency magnetron sputtering with double targets, BaTiO3 and SrTiO3. The epitaxial growth of the BST films was confirmed with x‐ray‐diffraction and reflection high‐energy electron‐diffraction analyses. The D–E hysteresis curve and the Curie temperature shift confirmed the BST films with Ba content x≥0.44 had ferroelectricity at room temperature. The mechanism of the ferroelectricity appearance was discussed in relation to the elongation of the c axis in the thickness direction, caused by lattice mismatch between Pt and BST.This publication has 8 references indexed in Scilit:
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