Integral Reflection Coefficient of X-ray Spectrometer Crystals

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Abstract
Analyzing crystals used in x-ray spectrometers have widely varying diffraction efficiencies. When employed in x-ray fluorescence analysis, the parameter which defines the efficiency is the integral reflection coefficient. This parameter has been measured using a single crystal spectrometer, as a function of wavelength, for a number of crystals commonly used. A recent adaptation of an existing diffraction theory is shown to make possible the calculation of integral reflection coefficients which agree with measured values.