A new, fast method for the computer simulation of CV profiles in multilayer structures
- 1 June 1991
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 50 (1-4) , 149-153
- https://doi.org/10.1016/0169-4332(91)90154-c
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A Novel Approach to the Assessment of Semiconductor Hetero-Interfaces in Multilayer StructuresMRS Proceedings, 1990
- A simple method of modelling the C-tV profiles of high-low junctions and heterojunctionsSolid-State Electronics, 1985
- Measurement of isotype heterojunction barriers by C-V profilingApplied Physics Letters, 1980
- The influence of debye length on the C-V measurement of doping profilesIEEE Transactions on Electron Devices, 1971