Two-Dimensional Mapping of pn Junctions by Electron Holography
- 1 November 2000
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 222 (1) , 213-217
- https://doi.org/10.1002/1521-3951(200011)222:1<213::aid-pssb213>3.0.co;2-h
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Characterization of two-dimensional dopant profiles: Status and reviewJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1996
- Direct observation of potential distribution across Si/Si p-n junctions using off-axis electron holographyApplied Physics Letters, 1994
- Electron Holographic Observations of the Electrostatic Field Associated with Thin Reverse-BiasedJunctionsPhysical Review Letters, 1985