A simple X-ray standing wave technique for surface structure determination - theory and an application
- 31 December 1988
- journal article
- Published by Elsevier in Surface Science
- Vol. 195 (1-2) , 237-254
- https://doi.org/10.1016/0039-6028(88)90794-7
Abstract
No abstract availableKeywords
This publication has 28 references indexed in Scilit:
- Complete Adsorption Site Information for Cl on Cu(111) Using X-Ray Absorption Fine Structure and Photoelectron DiffractionEurophysics Letters, 1986
- Soft x-ray beam line for surface EXAFS studies in the energy range 60≤hν≤11 100 eV at the Daresbury SRSReview of Scientific Instruments, 1986
- Fine structure in ionisation cross sections and applications to surface scienceReports on Progress in Physics, 1986
- Measurement of the silicon (111) surface contractionPhysical Review Letters, 1986
- X-ray standing-wave fluorescence analysis of electrodeposited Tl on clean and oxygen-reconstructed Cu(111)Physical Review B, 1985
- Effect of the Soft X-Ray Standing Wave Fields on the Total Electron Yield Spectra from an InP CrystalJapanese Journal of Applied Physics, 1985
- X-ray-standing-wave—modulated electron emission near absorption edges in centrosymmetric and noncentrosymmetric crystalsPhysical Review B, 1984
- A comparison of reliability (R) factors in a LEED structural analysis of the copper (111) surfaceJournal of Physics C: Solid State Physics, 1981
- X-Ray Standing Waves at Crystal SurfacesPhysical Review Letters, 1980
- An ultra-high-vacuum double crystal monochromator beam line for studies in the spectral range 500–4000 eVNuclear Instruments and Methods, 1980