Optical constants of evaporated gadolinium oxide
- 12 September 2001
- journal article
- Published by IOP Publishing in Journal of Optics A: Pure and Applied Optics
- Vol. 3 (6) , 452-454
- https://doi.org/10.1088/1464-4258/3/6/304
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Characterization of Gd[sub 2]O[sub 3] Films Deposited on Si(100) by Electron-Beam EvaporationJournal of the Electrochemical Society, 2001
- Quantitative analysis of metals in soil using X-ray fluorescenceSpectrochimica Acta Part B: Atomic Spectroscopy, 2000
- Thickness dependence of the optical properties of sputter deposited Ti oxide filmsThin Solid Films, 2000
- Analysis of trace Co in synthetic diamonds using synchrotron radiation excited X-ray fluorescence analysisJournal of Crystal Growth, 2000
- Optical properties of epitaxially grown zinc oxide films on sapphire by pulsed laser depositionJournal of Applied Physics, 1999
- Electrical Properties of Eu2O3 Thin FilmsPhysica Status Solidi (a), 1995
- Effect of UV exposure on optical properties of amorphous As_2S_3 thin filmsApplied Optics, 1990
- Matrix corrections for quantitative determination of trace elements in biological samples using energy‐dispersive X‐ray fluorescence spectrometryX-Ray Spectrometry, 1989
- Dielectric properties of electron-beam-evaporated Nd2O3 thin filmsThin Solid Films, 1982
- A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin filmJournal of Physics E: Scientific Instruments, 1976