Analysis of Timing Failures Due to Random AC Defects in VLSI Modules
- 1 January 1985
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 709-714
- https://doi.org/10.1109/dac.1985.1586020
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Quality Level and Fault Coverage for Multichip ModulesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983
- Timing Analysis of Computer HardwareIBM Journal of Research and Development, 1982