Relative X-ray cross sections and sensitivity of PIXE and RBS in surface analysis
- 1 April 1986
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 15 (1-6) , 407-409
- https://doi.org/10.1016/0168-583x(86)90332-0
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- A computer-controlled particle collection and surface analysis system for tokamak scrape-of-layer analysisNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1985
- A new approach to obtain an analytical expression for K shell ionization cross section in PWBANuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- An analytical cross-section formula for K X-ray production by protonsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- Applications of simultaneous ion backscattering and ion-induced X-ray emissionNuclear Instruments and Methods in Physics Research, 1983
- Energy-loss effect in inner-shell Coulomb ionization by heavy charged particlesPhysical Review A, 1981
- Atomic radiative and radiationless yields for K and L shellsJournal of Physical and Chemical Reference Data, 1979
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- Universal Cross Sections for-Shell Ionization by Heavy Charged Particles. I. Low Particle VelocitiesPhysical Review A, 1973