Applications of simultaneous ion backscattering and ion-induced X-ray emission
- 15 December 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 218 (1-3) , 420-424
- https://doi.org/10.1016/0167-5087(83)91015-3
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- The depth profile of high-dose low-mass ions implanted into higher mass substrate by RBS analysisNuclear Instruments and Methods in Physics Research, 1981
- Detection of trace elements in ash samples performed by combining RBS and PIXENuclear Instruments and Methods in Physics Research, 1981
- UHV-Compatible Collimator and Faraday Cup AssemblyReview of Scientific Instruments, 1973
- Study of aluminum oxide films by ion-induced x rays and Rutherford backscatteringJournal of Applied Physics, 1973