Limits of force microscopy
- 1 May 1995
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 66 (5) , 3191-3195
- https://doi.org/10.1063/1.1145550
Abstract
The atomic force microscope(AFM) is calculated to have quantum limited sensitivity using common optical detection techniques. Under typical ambient operating conditions, the AFM is shown to have an energy resolution better than 10−24 J, considerably weaker than the energy of 10−21 J/molecule for the weakest chemical bonds. For operation in vacuum, periodic forces of 10−15 N are detectable at room temperature. At 4.2 K it is possible to resolve single bursts of energy of 10−25 J. The AFM is shown to have many features in common with a resonant‐bar gravitational waveantenna.Keywords
This publication has 16 references indexed in Scilit:
- Observation of a chemical reaction using a micromechanical sensorChemical Physics Letters, 1994
- Mechanical-thermal noise in micromachined acoustic and vibration sensorsIEEE Transactions on Electron Devices, 1993
- Mechanical and thermal effects of laser irradiation on force microscope cantileversUltramicroscopy, 1992
- Mechanical parametric amplification and thermomechanical noise squeezingPhysical Review Letters, 1991
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991
- Atomic Force MicroscopyPhysics Today, 1990
- Improved fiber-optic interferometer for atomic force microscopyApplied Physics Letters, 1989
- Reduced-noise nonreciprocal transducer based upon vacuum tunnelingPhysical Review A, 1989
- Limits to the measurement of displacement in an interferometric gravitational radiation detectorJournal of Physics E: Scientific Instruments, 1978
- Ultimate sensitivity limit of a resonant gravitational wave antenna using a linear motion detectorPhysical Review D, 1976