Graphical method for the determination of junction parameters and of multiplication parameters
- 31 January 1970
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 13 (1) , 25-36
- https://doi.org/10.1016/0038-1101(70)90003-1
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Ionization Rates for Electrons and Holes in SiliconPhysical Review B, 1958
- Avalanche Breakdown in GermaniumPhysical Review B, 1955