Issues in fault modelling and testing of micropipelines
- 2 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Micropipelines, suggested by Ivan Sutherland (1989) form an elegant scheme for asynchronous implementation of pipelined circuits. The authors analyse the faulty behavior of micropipelines and propose schemes for testing. They suggest that the control part of the micropipeline is concurrently testable during normal operation and that test pattern generation for the data part logic can be reduced to that for combinational circuits, with a simple modification only in the test application method. Testing latches require a two-pattern test which can be generated using test pattern generation techniques for combinational circuits.Keywords
This publication has 2 references indexed in Scilit:
- A method of delay fault test generationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- MicropipelinesCommunications of the ACM, 1989