A high-sensitivity alternating-gradient magnetometer for use in quantifying magnetic force microscopy
- 15 April 1991
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 69 (8) , 5880-5882
- https://doi.org/10.1063/1.347855
Abstract
An extremely sensitive alternating gradient magnetometer (AGM) has been developed. This AGM has been designed as an aid in characterizing the response of magnetic force microscope tips to known magnetic fields and field gradients. It should also prove useful as a general purpose magnetometer for small samples. A sensitivity of ∼ 1.4 × 10−11 emu has been achieved. Minor improvements in vibration isolation should bring this number down to ∼ 10−12 emu. A sensitivity of ∼ 10−14 emu is theoretically possible. The capabilities of the AGM are illustrated with magnetization versus field data for an 8-μm Ni sphere.This publication has 3 references indexed in Scilit:
- Force microscope using a fiber-optic displacement sensorReview of Scientific Instruments, 1988
- Improvement of sensitivity of the vibrating reed magnetometerReview of Scientific Instruments, 1988
- An alternating-gradient magnetometer (invited)Journal of Applied Physics, 1988