Effects of detector nonlinearity on calibration and data reduction of rotating-analyzer ellipsometers
- 1 February 1976
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 66 (2) , 94-97
- https://doi.org/10.1364/josa.66.000094
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 10 references indexed in Scilit:
- Analysis of systematic errors in rotating-analyzer ellipsometers*Journal of the Optical Society of America, 1974
- Effects of component optical activity in data reduction and calibration of rotating-analyzer ellipsometersJournal of the Optical Society of America, 1974
- Design and operation of an automated, high-temperature ellipsometerJournal of the Optical Society of America, 1974
- Optimizing precision of rotating-analyzer ellipsometersJournal of the Optical Society of America, 1974
- Design and Operation of ETA, an Automated EllipsometerIBM Journal of Research and Development, 1973
- Fourier transform detection system for rotating-analyzer ellipsometersOptics Communications, 1973
- An Automatic Ellipsometer for Use in Electrochemical InvestigationsReview of Scientific Instruments, 1970
- A high speed precision automatic ellipsometerSurface Science, 1969
- Definitions and conventions in ellipsometrySurface Science, 1969
- Ellipsometry Using a Retardation Plate as Compensator*Journal of the Optical Society of America, 1967